The Defect Detection accelerated app is a machine vision application that automates detection of defects, maturity of products (e.g., fruits, PCBs), and sorting in high-speed factory pipelines by using computer vision library functions.
No, the app does not require any experience in FPGA design.
This application is free of charge from Xilinx.
No, the application has been optimized and tested for OnSemi’s AR0144. To adapt the application for another sensor, you will have to update the design and optimize the application for the new sensor.
Learn all about adaptive SOMs, including examples of why and how they can be deployed in next-generation edge applications, and how smart vision providers benefit from the performance, flexibility, and rapid development that can only be achieved by an adaptive SOM.