Defect Detection Accelerated Application

by: AMD

The Defect Detection accelerated application is a machine vision app that automates detection of defects, (e.g., fruits, PCBs), and sorting in high-speed factory pipelines by using Vitis Vision library functions.

Defect Detection Accelerated Application Block Diagram


  • Low latency defect detection pipeline​
  • Defect detection and sorting of fruits​
  • HDMI or DisplayPort out​
  • User programmable Vitis Vision library functions
  • Complete application with hardware design
Frequently Asked Questions

No, the app does not require any experience in FPGA design.

This application is free of charge from AMD.

No, the application has been optimized and tested for onsemi’s AR0144. To adapt the application for another sensor, you will have to update the design and optimize the application for the new sensor.

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